• DocumentCode
    628464
  • Title

    Failure analysis of thermally and mechanically stressed plastic core solder balls

  • Author

    Taklo, Maaike M. V. ; Graff, J. Seland ; Wright, D. Nilsen ; Kristiansen, Helge ; Hoff, Lars ; Waaler, K.

  • Author_Institution
    SINTEF, Norway
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    748
  • Lastpage
    754
  • Abstract
    Plastic Core Solder Balls (PCSB) offer improved mechanical compliance compared to traditional solder balls in assemblies where materials with significantly different coefficient of thermal expansion are present. However, failure mechanisms for systems with lead free PCSB have not been studied sufficiently to allow direct replacement in applications for harsh environments. An assembly of a ceramic carrier onto an organic circuit board intended for application in a harsh environment subsea has been studied with regard to replacement of traditional lead free solder balls with lead free PCSB. Assembled test vehicles were exposed to mechanical and thermal environmental stress testing and failure analysis performed. Degradation of the PCSBs was observed in electrical measurements and in studies of cross sectioned test vehicles. Cracks were observed in relation to formation of intermetallic compounds and a suggestion is made with regard to improvement of the metal system of the PCSBs.
  • Keywords
    alloys; ceramic packaging; cracks; failure analysis; flip-chip devices; printed circuit manufacture; printed circuit testing; soldering; PCSB; assembled test vehicle; ceramic carrier; crack formation; electrical measurement; failure analysis; harsh environment subsea; intermetallic compound; mechanical stress testing; mechanically stressed plastic core solder ball; organic circuit board; thermal environmental stress testing; thermally stressed plastic core solder ball; Assembly; Nickel; Scanning electron microscopy; Stress; Testing; Thermal stresses; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575656
  • Filename
    6575656