DocumentCode :
628468
Title :
Novel surface modification of nanosilica for low stress underfill
Author :
Ziyin Lin ; Yan Liu ; Kyoung-sik Moon ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
773
Lastpage :
777
Abstract :
We report a novel surface modification method to improve the interfacial bonding and compatibility of nanosilica with epoxy matrix. This approach utilized a two-layer modification strategy that not only provides a layer of functional groups at the surface to match the surface energy of nanosilica with epoxy resin, but also generates a large filler-matrix interphase transition region by covalent bonding that enables more efficient CTE reduction. It is found that dispersion of nanosilica is dramatically improved compared to untreated particles. The CTE of nanocomposites containing two-layer modified nanosilica is a 5-15 ppm/K lower than those filled with conventionally modified nanosilica at the similar loadings. Additionally, the nanocomposites developed in this study do not show significant Tg reduction. These results show that our surface modification method is very promising in developing novel nanosilica-based underfills.
Keywords :
adhesive bonding; integrated circuit packaging; nanocomposites; resins; silicon compounds; surface treatment; thermal expansion; three-dimensional integrated circuits; CTE reduction; SiO2; coefficient of thermal expansion; covalent bonding; epoxy matrix; epoxy resin; filler matrix interphase transition region; functional group; interfacial bonding; low stress underfill; surface energy; surface modification; two-layer modification strategy; Atmospheric measurements; Bonding; Nanocomposites; Polymers; Silicon compounds; Stress; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575660
Filename :
6575660
Link To Document :
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