Title :
Towards alternative technologies for fine pitch interconnects
Author :
Colonna, J.P. ; Segaud, R. ; Marion, F. ; Volpert, M. ; Garnier, A. ; Di Cioccio, L. ; Beillard, Y. ; Mermoz, S. ; de Crecy, F. ; Laviron, C. ; Cheramy, S.
Author_Institution :
LETI, CEA, Grenoble, France
Abstract :
This study focuses on alternative technologies for fine pitch 3D interconnect. These technologies are: μ-inserts (insertion of a nickel cylinder in Aluminium pad), μ-tubes (insertion of a hard tube in Aluminium pad), Transient Liquid Phase (TLP) bonding (whole solder reacts to form intermetallic compound) and copper direct bonding. In the first part the process flow is described. Then electrical performances are presented, including a comparison of the Kelvin resistance for each technology. The next part presents reliability considerations, where the failure modes and the weaknesses of each interconnect technologies are described. The mechanical impact of insertion technologies is also studied.
Keywords :
aluminium; bonding processes; integrated circuit interconnections; integrated circuit reliability; solders; μ-tubes; Al; Kelvin resistance; TLP bonding; aluminium pad; fine pitch 3D interconnect; interconnect technology; intermetallic compound; nickel cylinder; reliability; solder; transient liquid phase; Aluminum; Assembly; Bonding; Copper; Electron tubes; Kelvin; Resistance;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4799-0233-0
DOI :
10.1109/ECTC.2013.6575676