• DocumentCode
    628487
  • Title

    Flux-assisted self-assembly with microbump bonding for 3D heterogeneous integration

  • Author

    Ito, Yu ; Fukushima, Tetsuya ; Kang-Wook Lee ; Choki, Koji ; Tanaka, T. ; Koyanagi, Mitsumasa

  • Author_Institution
    Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    891
  • Lastpage
    896
  • Abstract
    We demonstrated a flip-chip self-assembly with Cu/Sn microbump bonding using surface tension of water-soluble fluxes. By using the self-assembly with the fluxes, 3-mm-square chips were aligned to hydrophilic assembly sites defined on a Si substrates in face-down bonding within approximately 2 μm alignment accuracy. The flux-assisted self-assembly can realize not only the precise chip alignment by high surface tension of the water-soluble fluxes, but also the highly reliable bump bonding with Sn solder in a sequence of self-assembly process. Here, we employed several fluxes as liquids for flip-chip self-assembly and compared the resulting alignment accuracies by changing concentrations of the fluxes. In addition, after microbump bonding, we evaluated electrical characteristics. The resulting daisy chains showed good electrical characteristics with contact resistances of 17 MΩ/bump or below without solder bridges and bonding failures.
  • Keywords
    flip-chip devices; hydrophilicity; integrated circuit bonding; integrated circuit packaging; self-assembly; soldering; surface tension; three-dimensional integrated circuits; 3D heterogeneous integration; bonding failures; face-down bonding; flip-chip; flux-assisted self-assembly; hydrophilic assembly; microbump bonding; solder bridges; surface tension; water-soluble fluxes; Accuracy; Assembly; Bonding; Liquids; Self-assembly; Substrates; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575679
  • Filename
    6575679