DocumentCode :
628495
Title :
Copper-filled anodic aluminum oxide: A potential substrate material for a high density interconnection
Author :
Horiuchi, Masaru ; Matsuda, Yuuki ; Tokutake, Yasue ; Fukasawa, Ryoichi ; Kobayashi, Takehiko
Author_Institution :
Fundamental Technol. Res. Dept., R & D, Shinko Electr. Ind., Nagano, Japan
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
937
Lastpage :
943
Abstract :
To realize high density 3D packaging, various types of interposer including through vias are developed. Although the interposer should have a high wiring density not only horizontally but also vertically, the ability of the conventional interposers to provide high density through vias with a low cost is still quite limited. Copper-filled anodic aluminum oxide has been studied as an alternative interposer material. Stable electrical connection was confirmed with four-wiring-layer substrates. High density vias as fine as 35 μm pitch were realized as a ground-surrounded structure. This coaxial-like via structure was remarkably effective for reducing harmful noise that tends to increase with the increased via density required for high performance systems.
Keywords :
aluminium compounds; copper; electric connectors; integrated circuit interconnections; integrated circuit noise; integrated circuit packaging; integrated circuit reliability; substrates; three-dimensional integrated circuits; wiring; coaxial-like via structure; copper-filled anodic aluminum oxide; four-wiring-layer substrate; ground-surrounded structure; high density 3D packaging; high density interconnection; high density vias; high performance system; interposer material; noise reduction; size 35 mum; stable electrical connection; substrate material; through vias; wiring density; Capacitance; Copper; Films; Inductance; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575687
Filename :
6575687
Link To Document :
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