Title :
Ultra-thin, self-healing decoupling capacitors on thin glass interposers using high surface area electrodes
Author :
Chakraborti, Parthasarathi ; Sharma, Himani ; Raj, P. Markondeya ; Tummala, Rao
Author_Institution :
3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents a novel set of low-cost materials and processes to fabricate thinfilm decoupling capacitors on silicon and glass substrates, using printed valve-metal electrodes. The valve-metals such as Al and Ta allow for easy formation of conformal, robust and high insulation-strength dielectrics. By utilizing self-healing counter electrodes, high yield with low leakage currents were demonstrated. Such a thinfilm capacitor processing is compatible with large-area, high through-put glass substrates with through-vias. The process, therefore, allows double-side passive or active component integration in ultrathin substrates, leading to a unique and novel passive and active component integration technology referred to as 3D IPAC (3-Dimensional Integrated Actives and Passive components) for miniaturized and complete power or RF modules.
Keywords :
aluminium; dielectric materials; electrochemical electrodes; silicon; substrates; thin film capacitors; three-dimensional integrated circuits; 3-Dimensional Integrated Actives and Passive components; 3D IPAC; Al; Si; SiO2; active component integration; dielectrics; double-side passive integration; glass substrates; printed valve-metal electrodes; self-healing counter electrodes; silicon substrates; thinfilm decoupling capacitors; ultrathin substrates; Aluminum; Capacitors; Electrodes; Radiation detectors; Silicon; Substrates;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4799-0233-0
DOI :
10.1109/ECTC.2013.6575701