DocumentCode :
628534
Title :
Wideband ultralow power distribution network impedance evaluation of decoupling capacitor embedded interposers for 3-D integrated LSI system
Author :
Kikuchi, Kazuro ; Gomyo, Toshio ; Ookubo, Tetsu ; Aoyagi, Masahiro ; Sudo, Toshio ; Otsuka, Kanji
Author_Institution :
NeRI, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1190
Lastpage :
1196
Abstract :
We evaluated low-impedance power distribution network (PDN) of decoupling capacitor embedded interposers for 3-D integrated LSI system. Measurements are carried out using the developed impedance analyzer system of a wide frequency range for evaluating ultralow impedance, and calculations are carried out using 2.5-D and 3-D finite element method (FEM) electromagnetic field simulator. We fabricated various types of capacitor mounted or capacitor embedded interposers test element group (TEG), such as surface-mounted and embedded chip capacitors, and thin film capacitors on silicon interposers using the same simple design to compare measurement results with calculation ones. As a result, the ultralow impedance evaluation system that has a high measurement dynamic range at the entire measurable frequency band can be realized. Furthermore, by using 2.5-D and 3-D FEM electromagnetic field simulator, it is expected that the accurate and wideband comparative verification of the PDN impedance analysis and evaluation can be realized.
Keywords :
coupled circuits; electric impedance measurement; embedded systems; finite element analysis; integrated circuit design; integrated circuit interconnections; integrated circuit measurement; large scale integration; surface mount technology; thin film capacitors; three-dimensional integrated circuits; 2.5D finite element method electromagnetic field simulator; 3D finite element method electromagnetic field simulator; 3D integrated LSI system; FEM; PDN; TEG; decoupling capacitor embedded interposer; embedded chip capacitor; impedance analyzer system; integrated circuit design; integrated circuit measurement; surface-mounted capacitor; test element group; thin film capacitor; wideband ultralow power distribution network impedance evaluation system; Capacitors; Finite element analysis; Frequency measurement; Impedance; Impedance measurement; Semiconductor device measurement; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575726
Filename :
6575726
Link To Document :
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