Title : 
Wideband ultralow power distribution network impedance evaluation of decoupling capacitor embedded interposers for 3-D integrated LSI system
         
        
            Author : 
Kikuchi, Kazuro ; Gomyo, Toshio ; Ookubo, Tetsu ; Aoyagi, Masahiro ; Sudo, Toshio ; Otsuka, Kanji
         
        
            Author_Institution : 
NeRI, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
         
        
        
        
        
        
            Abstract : 
We evaluated low-impedance power distribution network (PDN) of decoupling capacitor embedded interposers for 3-D integrated LSI system. Measurements are carried out using the developed impedance analyzer system of a wide frequency range for evaluating ultralow impedance, and calculations are carried out using 2.5-D and 3-D finite element method (FEM) electromagnetic field simulator. We fabricated various types of capacitor mounted or capacitor embedded interposers test element group (TEG), such as surface-mounted and embedded chip capacitors, and thin film capacitors on silicon interposers using the same simple design to compare measurement results with calculation ones. As a result, the ultralow impedance evaluation system that has a high measurement dynamic range at the entire measurable frequency band can be realized. Furthermore, by using 2.5-D and 3-D FEM electromagnetic field simulator, it is expected that the accurate and wideband comparative verification of the PDN impedance analysis and evaluation can be realized.
         
        
            Keywords : 
coupled circuits; electric impedance measurement; embedded systems; finite element analysis; integrated circuit design; integrated circuit interconnections; integrated circuit measurement; large scale integration; surface mount technology; thin film capacitors; three-dimensional integrated circuits; 2.5D finite element method electromagnetic field simulator; 3D finite element method electromagnetic field simulator; 3D integrated LSI system; FEM; PDN; TEG; decoupling capacitor embedded interposer; embedded chip capacitor; impedance analyzer system; integrated circuit design; integrated circuit measurement; surface-mounted capacitor; test element group; thin film capacitor; wideband ultralow power distribution network impedance evaluation system; Capacitors; Finite element analysis; Frequency measurement; Impedance; Impedance measurement; Semiconductor device measurement; Solid modeling;
         
        
        
        
            Conference_Titel : 
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
         
        
            Conference_Location : 
Las Vegas, NV
         
        
        
            Print_ISBN : 
978-1-4799-0233-0
         
        
        
            DOI : 
10.1109/ECTC.2013.6575726