• DocumentCode
    628574
  • Title

    Thermal and mechanical design and analysis of 3D IC interposer with double-sided active chips

  • Author

    Sheng-Tsai Wu ; Heng-Chieh Chien ; Lau, John H. ; Ming Li ; Cline, Julia ; Ji, Mingming

  • Author_Institution
    Electron. & Optoelectron. Res. Lab., Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1471
  • Lastpage
    1479
  • Abstract
    In this investigation, the thermal and mechanical design and analysis of a TSV (through-silicon via) interposer which supports 2 active chips on its top-side and 1 active chip on its bottom-side (a real 3D IC integration with an interposer) are studied. Emphasis is placed on the thermal design and analysis of the chips´ average temperatures and the applied cooling capability on the heat spreader/sink. To simplify the simulations, an equivalent model, that can preciously determine the thermal performances of TSVs and solder bumps/balls, is introduced instead of a complicate detail 3D model. Another emphasis is placed on the determination of the creep strain energy density per cycle of the solder bumps/balls between the chips and the TSV interposer, the TSV interposer and the organic package substrate, and the package substrate and the PCB (printed circuit board) under environmental thermal cycling condition.
  • Keywords
    cooling; elemental semiconductors; heat sinks; integrated circuit packaging; silicon; solders; thermal management (packaging); three-dimensional integrated circuits; 3D IC integration; 3D IC interposer; PCB; Si; TSV interposer; cooling capability; creep strain energy density; double-sided active chips; environmental thermal cycling condition; heat sink; heat spreader; mechanical design; organic package substrate; printed circuit board; solder balls; solder bumps; thermal design; through-silicon via interposer; Heat sinks; Heating; Integrated circuit modeling; Mathematical model; Thermal conductivity; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575766
  • Filename
    6575766