DocumentCode :
628611
Title :
Fine pitch flex-on-flex (FOF) assembly using nanofiber solder anisotropic conductive films (ACFs) and ultrasonic bonding method
Author :
Sang Hoon Lee ; Kyung Lim Suk ; Kyung-Wook Paik
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
1709
Lastpage :
1712
Abstract :
Nanofiber/solder ACFs are investigated in terms of ball movement and electrical properties depending on their nanofiber polymer types: polyacrylonitrile (PAN) and polyvinylidene fluoride (PVDF). For both nanofiber solutions, SAC305 (96.5% Sn, 3% Ag, 0.5% Cu with 217°C melting point) conductive solder balls were incorporated into nanofibers which were fabricated by electro-spinning method. Then, non-conductive films (NCFs) were laminated on top and bottom of the electrospun nanofibers to fabricate nanofiber/solder ACFs. For the bonding method, ultrasonic (U/S) bonding method was conducted to remove solder oxide which allowed fluxless soldering and reduced bonding time. PAN and PVDF nanofiber/solder ACFs successfully provided limitation of solder ball movement resulting in excellent ball capture rate on electrodes.
Keywords :
assembling; copper alloys; electrospinning; fine-pitch technology; nanofibres; polymer films; silver alloys; soldering; solders; tin alloys; ultrasonic bonding; FOF assembly; NCF; PAN; PVDF; SAC305; SnAgCu; ball capture rate; bonding time; conductive solder balls; electrical property; electro-spinning method; electrospun nanofibers; fine pitch flex-on-flex assembly; fluxless soldering; melting point; nanofiber ACF; nanofiber polymer types; nanofiber solder anisotropic conductive films; nanofiber solutions; nonconductive films; polyacrylonitrile; polyvinylidene fluoride; solder ACF; solder ball movement; solder oxide; ultrasonic bonding method; Acoustics; Assembly; Bonding; Contact resistance; Electrodes; Polymers; Resins;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575804
Filename :
6575804
Link To Document :
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