DocumentCode :
628684
Title :
Design and assembly process simulation for an automotive power module
Author :
Yong Liu ; Qiuxiao Qian ; Byoungok Lee ; Taekkeun Lee ; JoonSeo Son ; Oseob Jeon
Author_Institution :
Fairchild Semicond. Corp, Portland, ME, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
2144
Lastpage :
2150
Abstract :
In this paper, an automotive power module (APM) package is considered with multiple die including MOSFETs, passive components, shunt resistor and thermistor attached on the direct bonded copper (DBC) substrate. 3D finite element models for design and assembly process are generated in order to conduct the DoE numerical simulations for each design and assembly process. In design phase, both electrical and thermal simulations are carried out to improve the electrical and thermal performance. The electrical resistance and inductance are examined in order to minimize the package effects on Rds(on) and switching noise. Thermal characterization is conducted for the APM heat dissipation design evaluation. In assembly manufacturing process, molding is a very critical process to ensure the high reliability of the APM product. Molding simulation is discussed to check the flow front, gate design option and the possible voids track. The mechanical simulation is also conducted to check the warpages and stresses after molding and the APM mounting process to see if package cracking, or delamination might occur in these assembly processes. Modeling is conducted to determine the proper clamping force for low clearance and avoid high stress in ceramic.
Keywords :
MOSFET; assembling; automotive electronics; ceramics; cracks; design of experiments; electrical resistivity; electronics packaging; finite element analysis; moulding; 3D finite element model; APM heat dissipation design evaluation; APM mounting process; APM package; DBC substrate; DoE numerical simulation; MOSFET; assembly manufacturing process; assembly process simulation; automotive power module package; ceramic; design phase; die; direct bonded copper substrate; electrical resistance; electrical simulation; flow front; gate design option; inductance; mechanical simulation; molding simulation; package cracking; passive component; shunt resistor; switching noise; thermal characterization; thermal simulation; thermistor; warpage; Assembly; Atmospheric modeling; Clamps; Heat sinks; Integrated circuit modeling; Logic gates; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575877
Filename :
6575877
Link To Document :
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