Understanding loss mechanisms of passive interconnects with innovative/cost effective structure implementations for supporting 28Gbps and beyond transmission

Channel loss budgets are becoming more stringent as operating speeds increase. The loss mechanisms of these high-speed channels need to be properly understood in order to minimize the channel loss. The conductor loss, including skin effect loss and surface roughness loss as well as dielectric loss will be addressed theoretically and practically in various cases. This paper will study and identify which losses are primarily responsible for determining system performance in various cases.