• DocumentCode
    628697
  • Title

    Realization of ultra-low power I/O

  • Author

    Lei Shan ; Dickson, Timothy ; Young Kwark ; Baks, Christian ; Becker, Daniel ; Krabbenhoft, Roger ; Chainer, Timothy ; Mueller, Steffen ; Hoshino, Masayuki ; Kodemura, Junji ; Hashimoto, Mime ; Jimbo, Toshihiko ; Blatt, Christopher

  • Author_Institution
    IBM T J Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    2218
  • Lastpage
    2222
  • Abstract
    This paper summarizes the exploratory work conducted at IBM which seeks to reduce electrical I/O power consumption to facilitate both power distribution and device cooling for future exascale computing systems. The development of novel low-loss dielectric materials was coupled with design for performance to achieve low channel loss by minimizing reflections and energy dissipation due to non-ideal current return paths. A printed circuit board was fabricated and tested, with results confirming a 20% reduction of channel loss at 10GHz when compared to currently leading commercial materials. This 3dB improvement in loss for a 15dB channel, can offer a 50% I/O power reduction when used with power scalable driving/receiving circuits.
  • Keywords
    cooling; dielectric losses; dielectric materials; driver circuits; low-power electronics; printed circuit interconnections; printed circuit testing; IBM; channel loss; device cooling; electrical I-O power consumption; energy dissipation; frequency 10 GHz; future exascale computing system; loss 15 dB; loss 3 dB; low-loss dielectric material; nonideal current return path; power distribution; power scalable driving-receiving circuit; printed circuit board; ultralow power I-O; Copper; Dielectric losses; Dielectric measurement; Materials; Transmission line measurements; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575890
  • Filename
    6575890