DocumentCode :
628698
Title :
Assembly level digital image correlation under reflow and thermal cycling conditions
Author :
Ralph, W. Carter ; Raiser, G.F.
Author_Institution :
Southern Res. Inst., Birmingham, AL, USA
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
2223
Lastpage :
2227
Abstract :
Digital image correlation is an attractive displacement measurement method for thermo-mechanical characterization and simulation of electronic assemblies, but faces a number of challenges to implementation. In this paper, a batch reflow oven with a large window was used to allow for optical measurements, and hardware modifications and test methods were developed to enable successful data acquisition under both reflow and thermal cycling conditions. The modified hardware setup is detailed, test methods are presented, and two examples of successful experiments are demonstrated.
Keywords :
correlation methods; image processing; integrated circuit reliability; integrated circuit testing; life testing; solders; thermomechanical treatment; batch reflow oven; data acquisition; digital image correlation; electronic assemblies simulation; optical measurements; reflow conditions; thermal cycling conditions; thermomechanical characterization; Assembly; Cooling; Heating; Nitrogen; Optical distortion; Ovens; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575891
Filename :
6575891
Link To Document :
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