DocumentCode :
628709
Title :
Buffered distributed spray MOCVD reactor for LED production
Author :
Shaolin Hu ; Zhiyin Gan ; Sheng Liu
Author_Institution :
State Key Lab. for Digital Manuf. Equip. & Technol., Huazhong Univ. of Sci & Tech, Wuhan, China
fYear :
2013
fDate :
28-31 May 2013
Firstpage :
2286
Lastpage :
2291
Abstract :
In this paper we present design of a novel buffered distributed spray (BDS) MOCVD reactor, which is characterized by vertical distributed spray and horizontal radical flows. Theoretical studies have been performed about the reaction mechanisms of GaN films based on computational fluid dynamics (CFD) simulation to investigate the performance of the BDS reactor. Furthermore, we present the secondary ion mass spectroscopy (SIMS), transmission electron microscopy (TEM), X-ray diffraction (XRD) and photoluminescence (PL) test results to evaluate the quality of the LED epitaxial layers and the performance of the MOCVD system with BDS reactor. The results show that this system is of high performance for LED production, especially in the uniformity of growth rate, sharp interfaces in the MQWs structure and growth repeatability.
Keywords :
III-V semiconductors; MOCVD; X-ray diffraction; chemical reactors; computational fluid dynamics; gallium compounds; light emitting diodes; photoluminescence; secondary ion mass spectra; sprays; transmission electron microscopy; wide band gap semiconductors; BDS MOCVD reactor; CFD simulation; GaN; LED epitaxial layers; LED production; MQW structure; PL test; SIMS; TEM; X-ray diffraction; XRD; buffered distributed spray metal-organic chemical vapor deposition reactor; computational fluid dynamics simulation; horizontal radical flows; photoluminescence test; secondary ion mass spectroscopy; transmission electron microscopy; vertical distributed spray; Epitaxial layers; Gallium nitride; Inductors; Light emitting diodes; MOCVD; Quantum well devices; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
Conference_Location :
Las Vegas, NV
ISSN :
0569-5503
Print_ISBN :
978-1-4799-0233-0
Type :
conf
DOI :
10.1109/ECTC.2013.6575902
Filename :
6575902
Link To Document :
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