Title :
Scaling strategy for low power RF applications with multi gate oxide Dual Work function (DWF) MOSFETs utilizing self-aligned integration scheme
Author :
Miyata, T. ; Kawanaka, S. ; Hokazono, A. ; Ohguro, Tatsuya ; Toyoshima, Yoshiaki
Author_Institution :
Center for Semicond. R&D, Toshiba Corp., Yokohama, Japan
Abstract :
Dual Work Function (DWF)-MOSFET of 100 nm gate length device with self-aligned integration scheme was demonstrated utilizing conventional CMOS platform process for the first time. Here, we obtained not only the improved transconductance (GM) and drain conductance (GD), but also the enlarged operation voltage window employing multi gate oxide structure combined with DWF gate stack. Also, the discriminative features of DWF-MOSFET operation were revealed by TCAD analysis indicating the potential ability of reduced power consumption for RF applications.
Keywords :
CMOS integrated circuits; MOSFET; electric admittance; electrical conductivity; technology CAD (electronics); work function; CMOS platform process; DWF gate stack; DWF-MOSFET operation; RF applications; TCAD analysis; drain conductance; dual work function-MOSFET; low power RF applications; multigate oxide DWF MOSFET; multigate oxide dual work function MOSFET; multigate oxide structure; power consumption; scaling strategy; self-aligned integration scheme; size 100 nm; transconductance; Electric potential; Electrodes; Films; Logic gates; MOSFET; Performance evaluation; Radio frequency;
Conference_Titel :
VLSI Technology (VLSIT), 2013 Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-5226-0