Title :
RTN induced frequency shift measurements using a ring oscillator based circuit
Author :
Qianying Tang ; Xiaofei Wang ; Keane, John ; Kim, Chul Han
Author_Institution :
Dept. of ECE, Univ. of Minnesota, Minneapolis, MN, USA
Abstract :
The impact of random telegraph noise on ring oscillator (ROSC) frequency was measured for the first time using an on-chip beat frequency detection system. The proposed differential sensing scheme achieves a high frequency measurement resolution (>0.01%) at a short sampling time (>1μs) allowing efficient collection of RTN induced frequency shifts. Experimental data from a ROSC array fabricated in a 65nm LP process display both single trap and multi-trap RTN behavior. The voltage dependencies of the frequency shift and capture/emission times were measured and analyzed.
Keywords :
circuit noise; oscillators; telegraphy; ROSC frequency; RTN induced frequency shift measurements; on-chip beat frequency detection system; random telegraph noise; ring oscillator based circuit; size 65 nm; Arrays; Noise; Semiconductor device measurement; System-on-chip; Time measurement; Time-frequency analysis;
Conference_Titel :
VLSI Technology (VLSIT), 2013 Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-5226-0
