DocumentCode
62956
Title
A Multiple-Valued Decision Diagram Based Method for Efficient Reliability Analysis of Non-Repairable Phased-Mission Systems
Author
Yuchang Mo ; Liudong Xing ; Amari, S.V.
Author_Institution
Dept. ofComputer Sci. & Technol., Zhejiang Normal Univ., Jinhua, China
Volume
63
Issue
1
fYear
2014
fDate
Mar-14
Firstpage
320
Lastpage
330
Abstract
Many practical systems are phased-mission systems (PMSs), where the mission consists of multiple, consecutive, and non-overlapping phases of operation. An accurate reliability analysis of a PMS must consider statistical dependence of component states across phases, as well as dynamics in system configurations, success criteria, and component behavior. This paper proposes a new method based on multiple-valued decision diagrams (MDDs) for the reliability analysis of a non-repairable binary-state PMS. Due to its multi-valued logic nature, the MDD model has recently been applied to the reliability analysis of multistate systems. In this work, we present a novel way to adapt MDDs for the reliability analysis of systems with multiple phases. Examples show how the MDD models are generated and evaluated to obtain the mission reliability measures. Performance of the MDD-based method is compared with an existing binary decision diagram (BDD)-based method for PMS analysis. Empirical results show that the MDD-based method can offer lower computational complexity as well as a simpler model construction and improved evaluation algorithms over those used in the BDD-based method.
Keywords
binary decision diagrams; computational complexity; fault trees; multivalued logic; reliability; statistical analysis; BDD-based method; MDD model; MDD-based method; binary decision diagram-based method; component behavior; computational complexity; improved evaluation algorithms; multiple-valued decision diagram based method; multivalued logic nature; nonoverlapping phases; nonrepairable binary-state PMS analysis; nonrepairable phased-mission systems; reliability analysis; statistical component state dependence; success criteria; system configurations; Adaptation models; Analytical models; Boolean functions; Computational modeling; Data structures; Fault trees; Reliability; Binary decision diagram; fault tree; multiple- valued decision diagram; phased-mission system;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2014.2299497
Filename
6714462
Link To Document