• DocumentCode
    629597
  • Title

    An ontological foundation for conceptual modeling datatypes based on semantic reference spaces

  • Author

    Albuquerque, Andre ; Guizzardi, Giancarlo

  • Author_Institution
    Ontology & Conceptual Modeling Res. Group, Fed. Univ. of Espirito Santo (UFES), Vitoria, Brazil
  • fYear
    2013
  • fDate
    29-31 May 2013
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    Traditionally, instances of attributes in conceptual modeling languages are associated to values like “1,86”, “small” or “John”. But what do such values mean? What is the realworld semantics behind these attributes and their values? An approach to improve the semantics of conceptual modeling languages is to ground them on ontological theories. Following this strategy, over the last decade, the foundational ontology UFO has been applied to create the OntoUML modeling language, an ontologically well founded version of UML. In the current work we present extensions to UFO in order to improve the ontological foundations concerning value spaces by employing the notion Semantic Reference Spaces. A concrete application of this theory is presented, applying the proposed UFO extensions to ground an ontologically founded version of (Onto)UML Datatype classes. A prototype editor of the proposed extension to OntoUML is also presented in order to illustrate the applicability of the ideas discussed here.
  • Keywords
    Unified Modeling Language; ontologies (artificial intelligence); simulation languages; OntoUML modeling language; UFO; UML datatype class; conceptual modeling datatypes; conceptual modeling languages; ontological foundation; ontological theories; semantic reference space; Abstracts; Color; Context modeling; Ontologies; Semantics; Temperature measurement; Unified modeling language; Conceptual Modeling; Conceptual Spaces; Datatypes; Ontological Foundations; Reference Spaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research Challenges in Information Science (RCIS), 2013 IEEE Seventh International Conference on
  • Conference_Location
    Paris
  • ISSN
    2151-1349
  • Print_ISBN
    978-1-4673-2912-5
  • Type

    conf

  • DOI
    10.1109/RCIS.2013.6577693
  • Filename
    6577693