DocumentCode :
629682
Title :
Compact modeling solutions for OxRAM memories
Author :
Bocquet, Michael ; Deleruyelle, D. ; Aziza, H. ; Muller, Candice ; Portal, J.-M.
Author_Institution :
IM2NP, Aix-Marseille Univ., Marseille, France
fYear :
2013
fDate :
20-21 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
Emerging non-volatile memories based on resistive switching mechanisms pull intense R&D efforts from both academia and industry. Oxide-based Resistive Random Acces Memories (namely OxRAM) gather noteworthy performances, such as fast write/read speed, low power and high endurance outperforming therefore conventional Flash memories. To fully explore new design concepts such as distributed memory in logic, OxRAM compact models have to be developed and implemented into electrical simulators to assess performances at a circuit level. In this paper, we present an compact models of the bipolar OxRAM memory based on physical phenomenons. This model was implemented in electrical simulators for single device up to circuit level.
Keywords :
bipolar memory circuits; circuit simulation; integrated circuit design; integrated circuit modelling; random-access storage; R&D; bipolar OxRAM memory; compact modeling solution; distributed memory in logic; electrical simulator; flash memory; nonvolatile memory; oxide-based resistive random access memory; resistive switching mechanism; Hafnium compounds; Integrated circuit modeling; Mathematical model; Nonvolatile memory; Random access memory; Resistance; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4673-6105-7
Type :
conf
DOI :
10.1109/FTFC.2013.6577779
Filename :
6577779
Link To Document :
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