DocumentCode :
629684
Title :
Energy limits in A/D converters
Author :
Murmann, Boris
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2013
fDate :
20-21 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
Driven by ever-increasing application demands, the energy expended per A/D conversion has improved substantially over the last decade. This paper surveys the most recent trends and investigates practical energy limits of A/D converter architectures that are commonly employed in fine-line CMOS technology. We observe that today´s most efficient converters operate at about two orders of magnitude above the classical 8kT·SNR thermal limit. Furthermore, it is shown that a large fraction of today´s designs have approached ideal thermal limit lines, corresponding to a four-fold increase in energy per bit of resolution.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; A/D conversion; A/D converters; application demands; energy limits; fine-line CMOS technology; ideal thermal limit lines; Analog-digital conversion; CMOS integrated circuits; Energy resolution; Market research; Noise; Power dissipation; Thermal noise; CMOS; analog-to-digital converters; energy limits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4673-6105-7
Type :
conf
DOI :
10.1109/FTFC.2013.6577781
Filename :
6577781
Link To Document :
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