• DocumentCode
    629684
  • Title

    Energy limits in A/D converters

  • Author

    Murmann, Boris

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2013
  • fDate
    20-21 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Driven by ever-increasing application demands, the energy expended per A/D conversion has improved substantially over the last decade. This paper surveys the most recent trends and investigates practical energy limits of A/D converter architectures that are commonly employed in fine-line CMOS technology. We observe that today´s most efficient converters operate at about two orders of magnitude above the classical 8kT·SNR thermal limit. Furthermore, it is shown that a large fraction of today´s designs have approached ideal thermal limit lines, corresponding to a four-fold increase in energy per bit of resolution.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; A/D conversion; A/D converters; application demands; energy limits; fine-line CMOS technology; ideal thermal limit lines; Analog-digital conversion; CMOS integrated circuits; Energy resolution; Market research; Noise; Power dissipation; Thermal noise; CMOS; analog-to-digital converters; energy limits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Faible Tension Faible Consommation (FTFC), 2013 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-6105-7
  • Type

    conf

  • DOI
    10.1109/FTFC.2013.6577781
  • Filename
    6577781