DocumentCode
629928
Title
A comparative study between 4H-SiC and silicon power PiN diode having the same breakdown voltage 4KV
Author
Jedidi, Anis ; Garrab, Hatem ; Besbes, Khaoula
Author_Institution
Microelectron. & Instrum. UR FSM, Univ. of Monastir, Monastir, Tunisia
fYear
2013
fDate
21-23 March 2013
Firstpage
1
Lastpage
5
Abstract
The exploitation of silicon carbide semiconductor devices in power electronic field have made exceptional improvements by their fast switching and low dissipated losses especially at high operating temperatures, However, physical performances of silicon power components have reached their limits. This paper presents a comparative study, through numerical simulation and using the finite element method modeling, between 4H-SiC and silicon power PiN diode having the same breakdown voltage “4KV”. This comparative study highlights the benefits of silicon carbide.
Keywords
elemental semiconductors; finite element analysis; p-i-n diodes; power electronics; silicon compounds; 4H-SiC; Si; SiC; finite element method; power electronic field; silicon carbide semiconductor device; silicon power PiN diode; silicon power component; switching; voltage 4 kV; Doping; Mathematical model; Numerical models; PIN photodiodes; Semiconductor diodes; Silicon; Silicon carbide; 4H-SiC; Diode PiN; Numerical Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Engineering and Software Applications (ICEESA), 2013 International Conference on
Conference_Location
Hammamet
Print_ISBN
978-1-4673-6302-0
Type
conf
DOI
10.1109/ICEESA.2013.6578428
Filename
6578428
Link To Document