• DocumentCode
    629928
  • Title

    A comparative study between 4H-SiC and silicon power PiN diode having the same breakdown voltage 4KV

  • Author

    Jedidi, Anis ; Garrab, Hatem ; Besbes, Khaoula

  • Author_Institution
    Microelectron. & Instrum. UR FSM, Univ. of Monastir, Monastir, Tunisia
  • fYear
    2013
  • fDate
    21-23 March 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The exploitation of silicon carbide semiconductor devices in power electronic field have made exceptional improvements by their fast switching and low dissipated losses especially at high operating temperatures, However, physical performances of silicon power components have reached their limits. This paper presents a comparative study, through numerical simulation and using the finite element method modeling, between 4H-SiC and silicon power PiN diode having the same breakdown voltage “4KV”. This comparative study highlights the benefits of silicon carbide.
  • Keywords
    elemental semiconductors; finite element analysis; p-i-n diodes; power electronics; silicon compounds; 4H-SiC; Si; SiC; finite element method; power electronic field; silicon carbide semiconductor device; silicon power PiN diode; silicon power component; switching; voltage 4 kV; Doping; Mathematical model; Numerical models; PIN photodiodes; Semiconductor diodes; Silicon; Silicon carbide; 4H-SiC; Diode PiN; Numerical Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering and Software Applications (ICEESA), 2013 International Conference on
  • Conference_Location
    Hammamet
  • Print_ISBN
    978-1-4673-6302-0
  • Type

    conf

  • DOI
    10.1109/ICEESA.2013.6578428
  • Filename
    6578428