Title :
A 0.45–1V fully integrated reconfigurable switched capacitor step-down DC-DC converter with high density MIM capacitor in 22nm tri-gate CMOS
Author :
Jain, R. ; Geuskens, Bibiche ; Khellah, Muhammad M. ; Kim, Sungho ; Kulkarni, Jitendra ; Tschanz, James ; De, Vivek
Author_Institution :
Circuit Res. Lab., Intel Corp., Hillsboro, OR, USA
Abstract :
A fully integrated switched capacitor voltage regulator (SCVR) with on-die high density MIM capacitor, distributed across a 14KB register file (RF) load with an area overhead of 3.6% is demonstrated in 22nm tri-gate CMOS. The all-digital, multi-conversion-mode SCVR provides a wide output voltage range of 0.45-1V from a fixed input voltage of 1.225V. It achieves 63-84% conversion efficiency and supports a maximum load current density of 0.88 A/mm2.
Keywords :
CMOS integrated circuits; DC-DC power convertors; MIM devices; capacitors; switched capacitor networks; voltage regulators; all-digital multiconversion-mode SCVR; efficiency 63 percent to 84 percent; fully integrated SCVR; on-die high density MIM capacitor; register file load; size 22 nm; step-down DC-DC converrter; storage capacity 14 Kbit; switched capacitor voltage regulator; tri-gate CMOS; voltage 0.45 V to 1 V; voltage 1.225 V; Capacitors; Clocks; MIM capacitors; Radio frequency; Registers; Voltage control; Voltage measurement;
Conference_Titel :
VLSI Circuits (VLSIC), 2013 Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-5531-5
