Title :
A Heterogeneous Dual DLL and Quantization error minimized ZQ calibration for 30nm 1.2V 4Gb 3.2Gb/s/pin DDR4 SDRAM
Author :
Taesik Na ; Yong Shim ; Indal Song ; Jeong-kyoum Kim ; Seokhun Hyun ; Jun-Bae Kim ; Jung-Hwan Choi ; Chi-Wook Kim ; Jung-Bae Lee ; Joo Sun Choi
Author_Institution :
Samsung Electron., Hwasung, South Korea
Abstract :
This paper describes DLL architecture and ZQ calibration method for 30nm 1.2V 4Gb 3.2Gb/s/pin DDR4 SDRAM. Proposed DLL consists of one DLL with CML DCDL and another DLL with CMOS DCDL which tracks first one for low jitter and low power characteristics. Quantization error minimized (QEM) ZQ calibration is proposed for better signal integrity and yield improvement. The implemented DLL dissipates 6.5mW from a 1.2-V supply. Output jitter is 2.99 psrms with all high data, single bank read pattern and 7.75 psrms with random data, all bank interleaved read pattern. Despite 100 times of ZQ calibration, measured mismatch between pull up and pull down (MMPuPd) over all DQs is under 2 %.
Keywords :
DRAM chips; calibration; CMOS DCDL; DDR4 SDRAM; DLL architecture; QEM ZQ calibration; all bank interleaved read pattern; heterogeneous dual DLL; power 6.5 mW; quantization error minimized ZQ calibration; signal integrity; single bank read pattern; size 30 nm; voltage 1.2 V; CMOS integrated circuits; Calibration; Digital filters; Jitter; Power demand; Quantization (signal); SDRAM;
Conference_Titel :
VLSI Circuits (VLSIC), 2013 Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-5531-5