DocumentCode
630043
Title
820-GHz imaging array using diode-connected NMOS transistors in 130-nm CMOS
Author
Dae Yeon Kim ; Shinwoong Park ; Ruonan Han ; Kenneth, K.O.
Author_Institution
Texas Analog Center of Excellence, Univ. of Texas at Dallas, Richardson, TX, USA
fYear
2013
fDate
12-14 June 2013
Abstract
An 820-GHz 8×8 imaging array using diode-connected NMOS transistor detectors is demonstrated in 130-nm CMOS process. Measured mean responsivity of 3.4 kV/W and mean NEP of 28 pW/Hz1/2 at 1MHz modulation frequency are achieved. The NEP is 3.5X lower than that of NMOS and slightly lower than that of Schottky diode terahertz imaging arrays implemented in CMOS. The minimum NEP is 15.5 pW/Hz1/2, which is the lowest for THz detector arrays fabricated in CMOS. The imaging array occupies 2.0×1.7mm2 and the power consumption is 9.6 mW.
Keywords
CMOS integrated circuits; MOSFET; Schottky diodes; CMOS; NEP; Schottky diode terahertz imaging array; THz detector array; diode-connected NMOS transistor; frequency 820 GHz; power 9.6 mW; size 130 nm; Arrays; CMOS integrated circuits; Detectors; Frequency measurement; Imaging; Noise; Schottky diodes; CMOS; THz imager; detector; diode-connected NMOS transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits (VLSIC), 2013 Symposium on
Conference_Location
Kyoto
Print_ISBN
978-1-4673-5531-5
Type
conf
Filename
6578708
Link To Document