• DocumentCode
    630184
  • Title

    Shot noise suppression and coherent tunneling in a triple barrier resonant diode

  • Author

    Aleshkin, Vladimir Ya ; Reggiani, Luca

  • Author_Institution
    Inst. for Phys. of Microstructures, Nizhny Novgorod, Russia
  • fYear
    2013
  • fDate
    24-28 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We investigate shot noise suppression associated with coherent tunneling in a triple barrier resonant diode (TBRD). Here, due to the interaction between the two resonant states, the transmission probability, D (ϵ), can be non Lorentzian even in the case when the resonant level is far from the bottom of the emitter conduction band. We find that the resonant feature is narrower than that of the double barrier resonant diode (DBRD) [1] and it is asymmetric, i.e. non Lorentzian. The Fano factor is of about 0.3 at 4.2 K and slightly below 0.5 at 77 K. However, with respect to the DBRD both the current peak and the minimum value of the Fano factor shows up at a higher value of the applied voltage and their profiles are significantly smoothed out. The reason for that is a smoother dependence of the resonant level energy on applied voltage. For a better physical insight, we discuss the shot noise in an ideal TBRD, where the electron transparency can be unity or zero, thus shot noise is expected to be strongly suppressed. This conclusion is confirmed by the results of calculations which show that minima values of Fano factor in such structures can be significantly less than 0.5. Also, we found that an increase of electron concentration in the emitter further reduces the noise. The reason for this reduction is a decrease in thermal fluctuations of the occupation of electron states that provide the peak current where noise is minimal.
  • Keywords
    electron spin polarisation; noise abatement; photoemission; probability; resonant tunnelling diodes; semiconductor device noise; shot noise; DBRD; Fano factor; TBRD; coherent tunneling; double barrier resonant diode; electron concentration; electron transparency; emitter conduction band; nonLorentzian transmission probability; resonant level energy; shot noise suppression; temperature 4.2 K; temperature 77 K; thermal fluctuation; triple barrier resonant diode; Current density; Electric potential; Noise; Resonant tunneling devices; Semiconductor diodes; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2013 22nd International Conference on
  • Conference_Location
    Montpellier
  • Print_ISBN
    978-1-4799-0668-0
  • Type

    conf

  • DOI
    10.1109/ICNF.2013.6578928
  • Filename
    6578928