Title :
Low frequency noise in CMOS PNP PIN phototransistors
Author :
Kostov, Plamen ; Gaberl, Wolfgang ; Hofbauer, Michael ; Zimmermann, Horst
Author_Institution :
Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol. Vienna, Vienna, Austria
Abstract :
Low frequency noise on six different types of CMOS PNP PIN phototransistors was investigated and is presented in this paper. The output noise spectral density is evaluated by a noise model for the investigated phototransistors. The current gain β and the most dominant shot noise terms including their values of each phototransistor are extracted. The presented phototransistors show a good noise performance.
Keywords :
CMOS integrated circuits; integrated circuit noise; integrated optoelectronics; phototransistors; CMOS PNP PIN phototransistor; current gain; low frequency noise; noise model; output noise spectral density; shot noise; Current measurement; Noise; Noise figure; Phototransistors; Resistors; Thermal noise; CMOS; base resistor; bipolar; integrated; low frequency noise; optoelectronic; phototransistor; shot noise;
Conference_Titel :
Noise and Fluctuations (ICNF), 2013 22nd International Conference on
Conference_Location :
Montpellier
Print_ISBN :
978-1-4799-0668-0
DOI :
10.1109/ICNF.2013.6578993
