DocumentCode :
630220
Title :
Generation-recombination noise, Allan variance, and low-frequency gain instabilities in microwave amplifiers
Author :
Escotte, Laurent ; Gonneau, E.
Author_Institution :
LAAS, Univ. of Toulouse, Toulouse, France
fYear :
2013
fDate :
24-28 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
The stability of a microwave amplifier is reported in this paper. The presence of a generation-recombination noise source is investigated both in the frequency and time domains. An analytical expression of the Allan variance in the case of Lorentzian noise is originally determined in the time domain and agrees with previous work. The model is supported by experimental data realized at different temperatures which corroborates the presence of a thermally activated process.
Keywords :
frequency-domain analysis; low noise amplifiers; microwave amplifiers; stability; time-domain analysis; Allan variance; Lorentzian noise; frequency domains; generation-recombination noise; low-frequency gain instabilities; microwave amplifier stability; thermally activated process; time domains; Fluctuations; Microwave amplifiers; Microwave radiometry; Noise; Stability analysis; Temperature measurement; Thermal stability; Allan variance; Lorentzian noise; amplifiers; gain fluctuation; stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Noise and Fluctuations (ICNF), 2013 22nd International Conference on
Conference_Location :
Montpellier
Print_ISBN :
978-1-4799-0668-0
Type :
conf
DOI :
10.1109/ICNF.2013.6579003
Filename :
6579003
Link To Document :
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