Title :
Low-frequency noise in type-II superlattice MWIR nBn detector
Author :
Ciura, L. ; Kolek, Andrzej ; Zawislak, Z. ; Stadler, Adam W. ; Kowalewski, Adam ; Martyniuk, P. ; Wrobel, J. ; Rogalski, A. ; Gautam, Nishit ; Plis, Elena ; Krishna, Sanjay
Author_Institution :
Dept. of Electron. Fundamentals, Rzeszow Univ. of Technol., Rzeszów, Poland
Abstract :
The paper concerns low-frequency properties of mid-wavelength infrared type-II InAs/GaSb superlattice nBn detector. The current noise was directly measured in the range of 1-104 Hz at 77 K and detectivity was determined in this frequency range and temperature. The common 1/f component found in the noise spectra was shown to originate from random processes occurring in surface imperfections that modulate both side-wall leakage and bulk currents.
Keywords :
1/f noise; III-V semiconductors; gallium compounds; indium compounds; infrared detectors; random processes; semiconductor superlattices; 1/f noise component; InAs-GaSb; bulk current; current noise; frequency 1 Hz to 104 Hz; low frequency noise; midwavelength infrared superlattice nBn detector; random processes; sidewall leakage; surface imperfection; temperature 77 K; type-II superlattice MWIR nBn detector; Current measurement; Detectors; Frequency measurement; Noise; Noise measurement; Superlattices; Temperature measurement; 1/f noise; detectivity; infrared radiation; nBn detector; noise limitations;
Conference_Titel :
Noise and Fluctuations (ICNF), 2013 22nd International Conference on
Conference_Location :
Montpellier
Print_ISBN :
978-1-4799-0668-0
DOI :
10.1109/ICNF.2013.6579013
