Title :
Table of contents
Abstract :
The following topics are dealt with: microwave measurement system; and active device modeling.
Keywords :
measurement systems; microwave measurement; active device modeling; microwave measurement system;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579019
