DocumentCode :
630229
Title :
High resolution wideband calibration procedure for RF time-domain measurement of non-linear devices
Author :
El-Akhdar, K. ; Ahmed, Shehab ; Reveyrand, Tibault ; Neveux, Guillaume ; Barataud, Denis ; Nebus, J.M.
Author_Institution :
XLIM, Univ. of Limoges, Limoges, France
fYear :
2013
fDate :
7-7 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
This paper proposes a high resolution wideband calibration procedure for RF time-domain measurement of nonlinear devices. This calibration is based on the use of wideband multi-sine signal and is applied to a 4 channel Track and Hold Amplifier (THA) based measurement setup. The absolute magnitude and phase calibration is performed with a calibrated coherent interleaving sampling oscilloscope as reference. The new calibration procedure without any IF calibration assumption allows a 10 kHz resolution over 3 GHz bandwidth. A 40 W GaN high power amplifier, driven by a pulsed RF signal at the input, is characterized with this time-domain measurement setup. The fully calibrated measurement setup has the capability to give an accurate visualization of time-domain distortions on input/output voltage and current waveforms within the pulse. Calibrated rising and falling transitions of the pulse are also exhibited.
Keywords :
III-V semiconductors; calibration; frequency measurement; oscilloscopes; phase measurement; power amplifiers; radiofrequency amplifiers; sample and hold circuits; time measurement; wide band gap semiconductors; 4 channel track and hold amplifier; GaN; IF calibration; RF time-domain measurement; THA; absolute magnitude calibration; calibrated coherent interleaving sampling oscilloscope; current waveform; frequency 10 kHz; high power amplifier; high resolution wideband calibration procedure; input-output voltage; nonlinear device; phase calibration; power 40 W; pulsed RF signal; time-domain distortion visualization; wideband multisine signal; Calibration; Current measurement; Pulse measurements; Radio frequency; Signal resolution; Time-domain analysis; Voltage measurement; GaN; RF time-domain characterization; Wideband calibration; multi-sine; power amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
Type :
conf
DOI :
10.1109/ARFTG.2013.6579022
Filename :
6579022
Link To Document :
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