DocumentCode :
630232
Title :
An improved electric field probe with applications in high efficiency PA design and diagnostics
Author :
Dehghan, N. ; Cripps, Steve C. ; Porch, Adrian ; Lees, J.
Author_Institution :
Cardiff Univ., Cardiff, UK
fYear :
2013
fDate :
7-7 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
An Electric Field Probe is described, which has substantially improved bandwidth and spatial resolution compared to previously reported work [1]. Calibration tests on the reported probe shows a flat amplitude and phase response up to 6GHz. A novel calibration technique is described, which has enabled direct observation of device plane voltages in high power RFPAs. Results show evidence of various anomalous effects, including variation of voltage across the periphery of high power RF devices.
Keywords :
MMIC power amplifiers; calibration; electric fields; field effect MMIC; integrated circuit design; microwave measurement; voltage measurement; amplitude response; anomalous effect; calibration technique; electric field probe; flat amplitude response; high efficiency PA design; high power RFPA; phase response; voItage variation; Calibration; Conductors; Frequency control; Indexes; Performance evaluation; Radio frequency; Radiofrequency integrated circuits; High power amplifiers; microwave imaging; microwave measurements; microwave transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
Type :
conf
DOI :
10.1109/ARFTG.2013.6579026
Filename :
6579026
Link To Document :
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