• DocumentCode
    6308
  • Title

    Tolerance Values and the Confidence Level for High-Altitude Electromagnetic Pulse (HEMP) Field Tests

  • Author

    Sabath, Frank ; Potthast, Stefan

  • Author_Institution
    Bundeswehr Res. Inst. for Protective Technol. & NBC-Protection, Munster, Germany
  • Volume
    55
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    518
  • Lastpage
    525
  • Abstract
    This paper discusses tolerance values and confidence levels for high-altitude electromagnetic pulse (HEMP) field tests. An HEMP simulator provides the HEMP environment with various degrees of completeness. Deviations from the ideal waveform occur due to the simulator structure and concept. In this paper, we review tolerance values for pulse parameter specified in civil and military standards. The impact of the tolerated deviations on the test objective will be discussed. In the second part, we stress the aspect of how an HEMP test must be performed to provide sufficient confidence in the HEMP survivability of the system under test. This part starts with a brief description of a usual HEMP test setup and test procedures. Characteristics of the test procedure as well as the typical behavior of systems under tests are analyzed with statistical methods. Based on the statistical analysis, we define a confidence level, a measure of the confidence in the test result.
  • Keywords
    electromagnetic compatibility; electromagnetic pulse; standards; statistical analysis; HEMP simulator; civil standards; confidence level; high-altitude electromagnetic pulse field tests; military standards; simulator structure; statistical methods; test objective; tolerance values; Approximation methods; EMP radiation effects; Frequency domain analysis; IEC standards; Military standards; Time domain analysis; Electromagnetic pulse; confidence test; high-altitude electromagnetic pulse (HEMP); test methods; tolerance specification;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2012.2237032
  • Filename
    6409449