DocumentCode
63134
Title
Transient Behavior in TlBr Gamma-Ray Detectors and Its Analysis Using 3-D Position Sensing
Author
Thrall, C.L. ; Kaye, W.R. ; Zhong He ; Hadong Kim ; Cirignano, Leonard ; Shah, Karan
Author_Institution
Nucl. Eng. & Radiol. Sci. Dept., Univ. of Michigan, Ann Arbor, MI, USA
Volume
60
Issue
2
fYear
2013
fDate
Apr-13
Firstpage
1162
Lastpage
1167
Abstract
TlBr detectors have been investigated as room-temperature or close to ambient temperature operational semiconductor gamma-ray spectrometers. The three-dimensional position-sensitive single-polarity charge sensing technique, successfully used on CdZnTe gamma-ray imaging spectrometers, has been applied to 5-mm thick TlBr detectors and has resulted in energy resolutions as good as 0.73% FWHM and 0.97% FWHM at 662 keV on the best anode pixel and from all nine pixelated anodes respectively. The application of the three-dimensional position-sensing readout technology has significantly improved the spectroscopic performance of TlBr detectors, and has also enabled the study of transient behavior immediately following the application of cathode bias as a function of three-dimensional location within the TlBr detector material. This work presents the latest spectroscopic performance and characteristic initial transient behavior observed at -20°C on a number of 5-mm thick TlBr detectors manufactured by Radiation Monitoring Devices. Characterizing the initial transient behavior observed in TlBr detectors results in reconstruction technique improvement and may also lead to device fabrication improvements such that stable operation occurs immediately following bias for practical applications.
Keywords
gamma-ray detection; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 3D location; 3D position-sensing readout technology; 3D position-sensitive single-polarity charge sensing technique; CdZnTe gamma-ray imaging spectrometers; FWHM; TlBr detectors spectroscopic performance; TlBr gamma-ray detectors; ambient temperature operational semiconductor gamma-ray spectrometers; anode pixel; radiation monitoring devices; reconstruction technique; room-temperature; size 5 mm; temperature -20 degC; temperature 293 K to 298 K; Anodes; Cathodes; Detectors; Electron mobility; Energy resolution; Transient analysis; Room-temperature semiconductor; thallium-bromide;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2220567
Filename
6340374
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