DocumentCode :
631482
Title :
Phase Change Memories have taken the field
Author :
Bez, Riadh ; Cappelletti, Paolo ; Servalli, G. ; Pirovano, A.
Author_Institution :
Process R&D, Micron Semicond. Italia s.r.l., Agrate Brianza, Italy
fYear :
2013
fDate :
26-29 May 2013
Firstpage :
13
Lastpage :
16
Abstract :
Phase Change Memories (PCM) have been developed since few years and now they are in volume production, thus demonstrating the maturity of the technology. State of the art access time of 85ns, read throughput 266MB/s and write throughput 9MB/s combined with data retention, single bit alterability, execution in place and good cycling performance enables traditional NVM utilizations but also already opened applications in LPDDR field. In the following the technology status will be reviewed and future applications and development lines will be drawn.
Keywords :
phase change memories; LPDDR field; NVM utilizations; PCM; bit rate 266 Mbit/s; bit rate 9 Mbit/s; data retention; phase change memories; single bit alterability; time 85 ns; volume production; Arrays; Microprocessors; Nonvolatile memory; Phase change materials; Phase change memory; Reliability; PCM; Phase Change Memory; chalcogenide materials; emerging non-volatile memories;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Workshop (IMW), 2013 5th IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-6168-2
Type :
conf
DOI :
10.1109/IMW.2013.6582084
Filename :
6582084
Link To Document :
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