DocumentCode :
631829
Title :
Robust control of VO2-coated microactuators based on self-sensing feedback
Author :
Merced, Emmanuelle ; Jun Zhang ; Xiaobo Tan ; Sepulveda, Nelson
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear :
2013
fDate :
9-12 July 2013
Firstpage :
656
Lastpage :
661
Abstract :
A novel self-sensing and robust control technique is presented for a vanadium dioxide (VO2)-coated silicon (Si) microactuator. The deflection output of the microactuator is estimated by resistance-based self-sensing through a high-order polynomial model in order to eliminate the need for complicated sensing mechanisms. To accommodate the uncertainties produced by the hysteresis between the deflection and the temperature input, and the error in the self-sensing model, an H robust controller is designed and implemented for deflection control. The performance of the robust controller is tested in experiments under step and sinusoidal reference inputs and compared to that of a proportional-integral-derivative (PID) controller. The H controller outperforms the PID controller with 31% and 43% less root-mean-square-error for the step and sinusoidal references, respectively, while maintaining 3.1% less control effort for the latter.
Keywords :
mean square error methods; microactuators; robust control; three-term control; vanadium compounds; H∞ robust controller; VO2-coated microactuators; high-order polynomial model; proportional-integral-derivative controller; root-mean-square-error; self-sensing feedback; temperature input; vanadium dioxide; Electrical resistance measurement; Heating; Hysteresis; Microactuators; Resistance; Robustness; Temperature measurement; MEMS; Self-sensing feedback; microactuators; robust control; vanadium dioxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Intelligent Mechatronics (AIM), 2013 IEEE/ASME International Conference on
Conference_Location :
Wollongong, NSW
ISSN :
2159-6247
Print_ISBN :
978-1-4673-5319-9
Type :
conf
DOI :
10.1109/AIM.2013.6584167
Filename :
6584167
Link To Document :
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