• DocumentCode
    6322
  • Title

    Potential Design for Electron Transmission in Semiconductor Devices

  • Author

    Jun Zhang ; Kosut, Robert

  • Author_Institution
    Key Lab. of Syst. Control & Inf. Process., Shanghai Jiao Tong Univ., Shanghai, China
  • Volume
    21
  • Issue
    3
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    869
  • Lastpage
    874
  • Abstract
    In this brief, we discuss the design of electrostatic potential profile to achieve a desired electron transmission coefficient versus bias voltage characteristics in nanoscale semiconductor devices. This is a common problem in the design of many new electronic devices. We formulate it as a constrained optimization problem, and solve it by sequential linear programming. We further investigate the robust design of potential that is tolerant to noise, disturbance, and parameter uncertainty in the device.
  • Keywords
    linear programming; semiconductor device models; electron transmission coefficient; electronic devices; electrostatic potential; nanoscale semiconductor devices; parameter uncertainty; potential design; sequential linear programming; Algorithm design and analysis; Electric potential; IEEE Potentials; Linear programming; Optimization; Robustness; Semiconductor devices; Electron transmission; minimax; potential profile; robust optimal design; sequential linear programming;
  • fLanguage
    English
  • Journal_Title
    Control Systems Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-6536
  • Type

    jour

  • DOI
    10.1109/TCST.2012.2187337
  • Filename
    6169959