DocumentCode
6322
Title
Potential Design for Electron Transmission in Semiconductor Devices
Author
Jun Zhang ; Kosut, Robert
Author_Institution
Key Lab. of Syst. Control & Inf. Process., Shanghai Jiao Tong Univ., Shanghai, China
Volume
21
Issue
3
fYear
2013
fDate
May-13
Firstpage
869
Lastpage
874
Abstract
In this brief, we discuss the design of electrostatic potential profile to achieve a desired electron transmission coefficient versus bias voltage characteristics in nanoscale semiconductor devices. This is a common problem in the design of many new electronic devices. We formulate it as a constrained optimization problem, and solve it by sequential linear programming. We further investigate the robust design of potential that is tolerant to noise, disturbance, and parameter uncertainty in the device.
Keywords
linear programming; semiconductor device models; electron transmission coefficient; electronic devices; electrostatic potential; nanoscale semiconductor devices; parameter uncertainty; potential design; sequential linear programming; Algorithm design and analysis; Electric potential; IEEE Potentials; Linear programming; Optimization; Robustness; Semiconductor devices; Electron transmission; minimax; potential profile; robust optimal design; sequential linear programming;
fLanguage
English
Journal_Title
Control Systems Technology, IEEE Transactions on
Publisher
ieee
ISSN
1063-6536
Type
jour
DOI
10.1109/TCST.2012.2187337
Filename
6169959
Link To Document