Title :
Potential Design for Electron Transmission in Semiconductor Devices
Author :
Jun Zhang ; Kosut, Robert
Author_Institution :
Key Lab. of Syst. Control & Inf. Process., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
In this brief, we discuss the design of electrostatic potential profile to achieve a desired electron transmission coefficient versus bias voltage characteristics in nanoscale semiconductor devices. This is a common problem in the design of many new electronic devices. We formulate it as a constrained optimization problem, and solve it by sequential linear programming. We further investigate the robust design of potential that is tolerant to noise, disturbance, and parameter uncertainty in the device.
Keywords :
linear programming; semiconductor device models; electron transmission coefficient; electronic devices; electrostatic potential; nanoscale semiconductor devices; parameter uncertainty; potential design; sequential linear programming; Algorithm design and analysis; Electric potential; IEEE Potentials; Linear programming; Optimization; Robustness; Semiconductor devices; Electron transmission; minimax; potential profile; robust optimal design; sequential linear programming;
Journal_Title :
Control Systems Technology, IEEE Transactions on
DOI :
10.1109/TCST.2012.2187337