DocumentCode :
6322
Title :
Potential Design for Electron Transmission in Semiconductor Devices
Author :
Jun Zhang ; Kosut, Robert
Author_Institution :
Key Lab. of Syst. Control & Inf. Process., Shanghai Jiao Tong Univ., Shanghai, China
Volume :
21
Issue :
3
fYear :
2013
fDate :
May-13
Firstpage :
869
Lastpage :
874
Abstract :
In this brief, we discuss the design of electrostatic potential profile to achieve a desired electron transmission coefficient versus bias voltage characteristics in nanoscale semiconductor devices. This is a common problem in the design of many new electronic devices. We formulate it as a constrained optimization problem, and solve it by sequential linear programming. We further investigate the robust design of potential that is tolerant to noise, disturbance, and parameter uncertainty in the device.
Keywords :
linear programming; semiconductor device models; electron transmission coefficient; electronic devices; electrostatic potential; nanoscale semiconductor devices; parameter uncertainty; potential design; sequential linear programming; Algorithm design and analysis; Electric potential; IEEE Potentials; Linear programming; Optimization; Robustness; Semiconductor devices; Electron transmission; minimax; potential profile; robust optimal design; sequential linear programming;
fLanguage :
English
Journal_Title :
Control Systems Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-6536
Type :
jour
DOI :
10.1109/TCST.2012.2187337
Filename :
6169959
Link To Document :
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