• DocumentCode
    632345
  • Title

    D2. Testing of 1.5 Bit per Stage Pipelined Analog to Digital Converter: 5 Bits Case Study

  • Author

    Hamed, Sahar ; Khalil, A.H. ; Abdelhalim, M.B. ; Amer, Hassanein H. ; Madian, Ahmed H.

  • Author_Institution
    Electronics and Communications Department, Faculty of Engineering, Cairo University, Cairo, Egypt
  • fYear
    2013
  • fDate
    16-18 April 2013
  • Firstpage
    439
  • Lastpage
    447
  • Abstract
    Nowadays, Analog to Digital converters are the main building blocks of mixed analog/digital signal circuits, hence testing ADC circuits has become mandatory. The pipelined Analog-to-Digital Converter (PADC) is widely used with its famous 1.5 bit/stage architecture. In this paper, a low-cost test is developed for a 5 bit PADC. The 5 bits PADC consists of 3-stage (1.5 bit/stage) PADC followed by a 2 bit flash ADC. Then, the digital output of the 4-stage PADC is followed by its time alignment and Digital Error Correction (DEC) circuits. They are based on a 90 nm CMOS technology. It is proved that only six DC test values can detect 96.3% of catastrophic faults in the fault set. An extra analog pin is required in order to achieve 100% fault coverage. The Eldo simulator provided by Mentor Graphics was used in the analysis.
  • Keywords
    1.5 bit/stage; PADC; catastrophic faults; structural testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Conference (NRSC), 2013 30th National
  • Conference_Location
    Cairo, Egypt
  • Print_ISBN
    978-1-4673-6219-1
  • Type

    conf

  • DOI
    10.1109/NRSC.2013.6587946
  • Filename
    6587946