Title :
Porous silicon prepared from p− and p++ bulk silicon
Author :
Derek, V. ; Baltic, Romana ; Marcijus, Marijan ; Ristic, M. ; Orel, Zorica Crnjak ; Ivanda, M.
Author_Institution :
Div. of Mater. Phys., Ruder Boskovic Inst., Zagreb, Croatia
Abstract :
Macro and meso-porous silicon (PSi) samples were prepared by electrochemical anodisation of p- and p++ doped silicon wafers in hydrofluoric acid (HF) based electrolyte under galvanostatic conditions. Anodisation time and current were varied in order to obtain different PSi morphologies. Samples were characterized by scanning electron microscopy (SEM), photoluminescence (PL) spectroscopy and Raman spectroscopy. Samples prepared on p- type substrates were macro-porous, showed visible photoluminescence and no observable phonon confinement in Raman spectrum. Porous silicon prepared on p++ type substrates was mesoporous, showed no observable photoluminescence and intense phonon confinement was observed in their Raman spectra. Silicon nanocrystal dimensions in PSi samples obtained from photoluminescence and phonon confinement models were correlated with silicon electrochemical dissolution valence nd. A surface morphology instability is identified in case where electrolyte is more conductive than the silicon substrate.
Keywords :
Raman spectra; anodisation; dissolving; electrolytes; elemental semiconductors; mesoporous materials; phonons; photoluminescence; porous semiconductors; scanning electron microscopy; semiconductor growth; silicon; surface morphology; Raman spectroscopy; SEM; Si; electrochemical anodisation; electrochemical dissolution valence; galvanostatic conditions; hydrofluoric acid-based electrolyte; macroporous silicon; mesoporous silicon; nanocrystal dimensions; p++ type substrates; phonon confinement; photoluminescence; scanning electron microscopy; surface morphology instability; Morphology; Nanocrystals; Photoluminescence; Scanning electron microscopy; Silicon; Substrates; Surface morphology;
Conference_Titel :
Information & Communication Technology Electronics & Microelectronics (MIPRO), 2013 36th International Convention on
Conference_Location :
Opatija
Print_ISBN :
978-953-233-076-2