• DocumentCode
    63323
  • Title

    RF Linearity Potential of Carbon-Nanotube Transistors Versus MOSFETs

  • Author

    Alam, Ahsan U. ; Rogers, C.M.S. ; Paydavosi, Navid ; Holland, Kyle D. ; Ahmed, Shehab ; Vaidyanathan, Mani

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
  • Volume
    12
  • Issue
    3
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    340
  • Lastpage
    351
  • Abstract
    Carbon-nanotube, field-effect transistors (CNFETs) are among the candidates for emerging radio-frequency applications, and improved linearity has recently been identified as one of the performance advantages they might offer. In this paper, the potential for improved linearity has been investigated by considering an array-based device structure under the best-case scenario of ballistic transport. A nonlinear equivalent circuit for ballistic field-effect transistors is used to compare the linearity of CNFETs to conventional MOSFETs. We show that nanotube devices working at high frequencies are not inherently linear, as recently suggested in the literature, and that CNFETs exhibit overall linearity that is comparable to their MOSFET counterparts. The nonlinear quantum capacitance is identified to be a major source of high-frequency nonlinearity in CNFETs. The impacts of device parameters such as oxide capacitance, channel width, and tube pitch are also investigated.
  • Keywords
    MOSFET; ballistic transport; capacitance; carbon nanotube field effect transistors; carbon nanotubes; equivalent circuits; C; MOSFET; RF linearity potential; array-based device structure; ballistic field-effect transistors; ballistic transport; carbon-nanotube field-effect transistor linearity; channel width; device parameters; high-frequency nonlinearity source; improved linearity; nanotube devices; nonlinear equivalent circuit; nonlinear quantum capacitance; overall linearity; oxide capacitance; radiofrequency applications; tube pitch; CNTFETs; Electron tubes; Linearity; Logic gates; MOSFETs; Quantum capacitance; Carbon nanotube (CN); field-effect transistor (FET); high-frequency behavior; input-intercept point (IIP3); linearity; small-signal circuit; top-of-the-barrier model; tube pitch;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2013.2248019
  • Filename
    6466389