DocumentCode
63323
Title
RF Linearity Potential of Carbon-Nanotube Transistors Versus MOSFETs
Author
Alam, Ahsan U. ; Rogers, C.M.S. ; Paydavosi, Navid ; Holland, Kyle D. ; Ahmed, Shehab ; Vaidyanathan, Mani
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
Volume
12
Issue
3
fYear
2013
fDate
May-13
Firstpage
340
Lastpage
351
Abstract
Carbon-nanotube, field-effect transistors (CNFETs) are among the candidates for emerging radio-frequency applications, and improved linearity has recently been identified as one of the performance advantages they might offer. In this paper, the potential for improved linearity has been investigated by considering an array-based device structure under the best-case scenario of ballistic transport. A nonlinear equivalent circuit for ballistic field-effect transistors is used to compare the linearity of CNFETs to conventional MOSFETs. We show that nanotube devices working at high frequencies are not inherently linear, as recently suggested in the literature, and that CNFETs exhibit overall linearity that is comparable to their MOSFET counterparts. The nonlinear quantum capacitance is identified to be a major source of high-frequency nonlinearity in CNFETs. The impacts of device parameters such as oxide capacitance, channel width, and tube pitch are also investigated.
Keywords
MOSFET; ballistic transport; capacitance; carbon nanotube field effect transistors; carbon nanotubes; equivalent circuits; C; MOSFET; RF linearity potential; array-based device structure; ballistic field-effect transistors; ballistic transport; carbon-nanotube field-effect transistor linearity; channel width; device parameters; high-frequency nonlinearity source; improved linearity; nanotube devices; nonlinear equivalent circuit; nonlinear quantum capacitance; overall linearity; oxide capacitance; radiofrequency applications; tube pitch; CNTFETs; Electron tubes; Linearity; Logic gates; MOSFETs; Quantum capacitance; Carbon nanotube (CN); field-effect transistor (FET); high-frequency behavior; input-intercept point (IIP3); linearity; small-signal circuit; top-of-the-barrier model; tube pitch;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2013.2248019
Filename
6466389
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