DocumentCode :
633833
Title :
Development and application of prognostics and health management technology
Author :
Xie Shao-feng ; En Yun-Fei ; Lin Xiao-ling ; Lu Yu-Dong ; Chen Yi-qiang
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electr. Component, China Electron. Product Reliability & Environ. Testing Res. Inst., Guangzhou, China
fYear :
2013
fDate :
15-19 July 2013
Firstpage :
3
Lastpage :
7
Abstract :
Prognostics and health management (PHM) refers to functions that equipment in use can automatically complete the fault detection, prediction, isolation and monitoring, and timely fault impact assessment, fault report and condition monitoring management. This paper analyzes the requirement of engineering application and development of PHM technology. It focuses on three aspects technical problems of the application of PHM technology, including fault diagnosis and prediction model based on physics-of-failure (PoF), data mining technology and special sensors for critical failure mechanism of MOS devices. Correspondingly, present research work on these three aspects is introduced.
Keywords :
MIS devices; condition monitoring; data mining; failure analysis; fault diagnosis; sensors; MOS devices; PHM technology; PoF; condition monitoring management; critical failure mechanism; data mining technology; fault detection; fault diagnosis-prediction model; fault impact assessment; fault isolation; fault monitoring; fault report; physics-of-failure; prognostic-health management technology; Analytical models; Failure analysis; Materials; Prognostics and health management; Reliability engineering; Stress; data mining; fault model; prognostics and health management; sensor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location :
Suzhou
ISSN :
1946-1542
Print_ISBN :
978-1-4799-1241-4
Type :
conf
DOI :
10.1109/IPFA.2013.6599117
Filename :
6599117
Link To Document :
بازگشت