Title :
Design flow and techniques for fault-tolerant ASIC
Author :
Stamenkovic, Z. ; Petrovic, V. ; Schoof, G.
Author_Institution :
IHP, Frankfurt (Oder), Germany
Abstract :
The paper presents a design flow for fault-tolerant CMOS ASICs which are immune to the single event upsets (SEU), the single event transients (SET), and the single event latchup (SEL). Triple and double modular redundant (TMR and DMR) circuits and SEL protection switches (SPS) make the base for design of the highly reliable ASIC. The SPS had been designed, characterised, and verified before it became a standard library cell. The proposed design flow requires the standard design automation tools and a few additional steps during logic synthesis and layout generation. An extra step is necessary to generate the redundant design net-list including voters. Other two extra steps (definition of the power domains and placement of the SPS) have to be performed in the layout phase. The concept has been verified on the example of a shift-register.
Keywords :
CMOS logic circuits; application specific integrated circuits; integrated circuit layout; integrated circuit reliability; logic design; radiation hardening (electronics); shift registers; SEL protection switches; SET; SEU; SPS placement; design flow; double-modular redundant circuit; fault-tolerant CMOS ASIC; highly-reliable ASIC; layout generation; layout phase; logic synthesis; power domain definition; redundant design net-list; shift-register; single-event latchup; single-event transients; single-event upsets; standard design automation tool; standard library cell; triple-modular redundant circuit; Circuit faults; Fault tolerance; Fault tolerant systems; Integrated circuit modeling; Switches; Transistors; Tunneling magnetoresistance; ASIC design; Single event effect; fault tolerance; latchup protection switch; triple and double modular redundancy;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location :
Suzhou
Print_ISBN :
978-1-4799-1241-4
DOI :
10.1109/IPFA.2013.6599133
