Title :
Modeling the effect of process variations on the delay and power of the digital circuit using fast simulators
Author :
Amirsoleimani, Amirali ; Soleimani, Hossein ; Ahmadi, Amin ; Bavandpour, Mohammad ; Zwolinski, Mark
Author_Institution :
Electr. Eng. Dept., Razi Univ., Kermanshah, Iran
Abstract :
Process variation has an increasingly dramatic effect on delay and power as process geometries shrink. Even if the amount of variation remains the same as in previous generations, it accounts for a greater percentage of process geometries as they get smaller. So an accurate prediction of path delay and power variability for real digital circuits in the current technologies is very important; however, its main drawback is the high runtime cost. In this paper, we present a new fast EDA tool which accelerates Monte Carlo based statistical static timing analysis (SSTA) for complex digital circuit. Parallel platforms like Message Passing Interface and POSIX® Threads and also the GPU-based CUDA platform suggests a natural fit for this analysis. So using these platforms, Monte Carlo based SSTA for complex digital circuits at 32, 45 and 65 nm has been performed. and of the pin-to-output delay and power distributions for all basic gates are extracted using a memory lookup from Hspice and then the results are extended to the complex digital circuit in a hierarchal manner on the parallel platforms. Results show that the GPU-based platform has the highest performance (speedup of 19×). The correctness of the Monte Carlo based SSTA implemented on a GPU has been verified by comparing its results with a CPU based implementation.
Keywords :
Monte Carlo methods; SPICE; digital circuits; electronic design automation; graphics processing units; logic gates; message passing; parallel architectures; statistical analysis; CUDA platform; EDA tool; GPU; HSPICE; Monte Carlo based statistical static timing analysis; POSIX threads; SSTA; basic gates; digital circuit; memory lookup; message passing interface; parallel platform; power distribution; process geometry; process variation; size 32 nm; size 45 nm; size 65 nm; Delays; Digital circuits; Graphics processing units; Instruction sets; Integrated circuit modeling; Logic gates; Monte Carlo methods; Graphic Processing Unit (GPU); Message Passing Interface (MPI); Monte Carlo; POSIX® Thread (Pthread); Statistical timing;
Conference_Titel :
Electrical Engineering (ICEE), 2013 21st Iranian Conference on
Conference_Location :
Mashhad
DOI :
10.1109/IranianCEE.2013.6599689