Title :
Low jitter, high voltage, repetitive laser triggered gas switches
Author :
Hegeler, Frank ; Myers, Matthew C. ; Wolford, Matthew F. ; Sethian, John D. ; Fielding, Andrew M.
Author_Institution :
Commonwealth Technol., Inc., Alexandria, VA, USA
Abstract :
The Electra pulsed power system at the Naval Research Laboratory is capable of supplying 16 kJ to a low impedance load within 140 ns, and it allows continuous operation of up to 5 pulses per second for several hours. Four laser triggered SF6 gas switches transfer the stored pulse forming line energy to the load. Each switch has a hold-off voltage of more than 1 MV and transfers a charge of 10 mC per shot. This paper describes the redesign of the gas switch with hemispherical electrodes to a flat electrode configuration, which led to an improvement in switch reliability. A one sigma switch jitter of ±1.2 ns has been achieved for tens of thousands of continuous shots, with an electrode erosion rate as low as 1 mg/C. Detailed statistical analyses are provided when the switches are operated at a SF6 pressure of 0.36 - 0.69 MPa, with a laser trigger energy of 1 - 18 mJ at 266 nm, and a switch hold-off voltage ranging from 0.7 - 1.2 MV.
Keywords :
SF6 insulation; electrodes; power system reliability; pulsed power switches; statistical analysis; switchgear insulation; Electra pulsed power system; Naval Research Laboratory; electrode erosion rate; energy 1 mJ to 18 mJ; flat electrode configuration; hemispherical electrodes; high voltage laser triggered gas switches; hold-off voltage; laser triggered SF6 gas switches; low jitter laser triggered gas switches; pressure 0.36 MPa to 0.69 MPa; repetitive laser triggered gas switches; sigma switch jitter; statistical analyses; stored pulse forming line energy; switch hold-off voltage; switch reliability; time 140 ns; voltage 0.7 MV to 1.2 MV; Electric fields; Electrodes; Gas lasers; Laser beams; Optical switches; Power lasers; Sulfur hexafluoride; Laser triggered gas switches; SF6; pulse power system; reliability testing;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2013.6571432