DocumentCode
634452
Title
Reviewers
fYear
2013
fDate
5-7 July 2013
Abstract
The conference offers a note of thanks and lists its reviewers.
fLanguage
English
Publisher
ieee
Conference_Titel
Biometrics and Kansei Engineering (ICBAKE), 2013 International Conference on
Conference_Location
Tokyo, Japan
Type
conf
DOI
10.1109/ICBAKE.2013.75
Filename
6603454
Link To Document