Abstract :
The following topics are dealt with: fault tolerance; aging; variability; microprocessor testing; vulnerability analysis; silicon debug and diagnosis; error detection; economics of reliability; approximate computing; error resilient design; analog measurements and monitoring; SER analysis; FPGA; flash memories; online hardware security; GPU reliability; and errors in memories.
Keywords :
ageing; error detection; fault tolerance; field programmable gate arrays; flash memories; integrated circuit reliability; integrated circuit testing; microprocessor chips; radiation hardening (electronics); FPGA; GPU reliability; SER analysis; aging; analog measurements; analog monitoring; approximate computing; error detection; error resilient design; fault tolerance; flash memories; microprocessor testing; online hardware security; reliability economics; silicon debugging; silicon diagnosis; vulnerability analysis;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location :
Chania
DOI :
10.1109/IOLTS.2013.6604041
