Title :
Hardening of serial communication protocols for potentially critical systems in automotive applications: LIN bus
Author :
Vaskova, A. ; Portela-Garcia, M. ; Garcia-Valderas, M. ; Lopez-Ongil, C. ; Sonza Reorda, M.
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganés, Spain
Abstract :
Serial communications protocols used in automotive systems must comply with different levels of robustness. Some subsystems in charge of n on-critical tasks are composed of cheaper and non-fault tolerant elements. As Single Event Upsets also affect these sub-systems, a complete analysis of heir robustness could highlight the critical elements and point out the possible solutions, such as selective hardening in a cost effective way. An extensive fault injection campaign has been applied to a LIN bus controller module in order to select the best mitigation techniques to harden it against soft errors. A discussion around how these mitigation techniques could affect on-line testing in the module is also presented.
Keywords :
automotive electronics; fault tolerance; peripheral interfaces; protocols; LIN bus controller module; automotive applications; fault injection campaign; mitigation techniques; nonfault tolerant elements; on-line testing; potentially critical systems; selective hardening; serial communication protocol hardening; single event upsets; Decision support systems; Testing; Distributed Networks; LIN Bus; Mitigation Techniques; SEUs;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location :
Chania
DOI :
10.1109/IOLTS.2013.6604044