DocumentCode :
634763
Title :
DC and RF measurements of superconducting-ferromagnetic multi-terminal devices
Author :
Prokopenko, Georgy V. ; Mukhanov, Oleg A. ; Nevirkovets, Ivan P. ; Chernyashevskyy, Oleksandr ; Ketterson, John B.
Author_Institution :
HYPRES, Inc., Elmsford, NY, USA
fYear :
2013
fDate :
7-11 July 2013
Firstpage :
1
Lastpage :
4
Abstract :
We report experimental results of the DC and RF characterization of multi-terminal SFIFSIS devices (where S, I, and F denote a superconductor (Nb), an insulator (AlOx), and a ferromagnetic material (Ni), respectively), which display transistor-like properties. Applying a 0.2 MHz signal in addition to a constant DC bias current to the injector (SFIFS) junction, we observe a voltage gain of ~1.25 on the acceptor SIS junction, if operation point of the SIS junction is chosen in the sub-gap region of its current-voltage characteristic. We also observed a good input-output isolation of our SFIFSIS devices of the order of 30 dBV. The experiments indicate that, after optimization of the geometry and improvement of junction quality, these devices can be used as input-output isolators and amplifiers for memory, digital and RF applications.
Keywords :
aluminium compounds; ferromagnetic materials; insulators; nickel; niobium; superconducting devices; AlOx; DC bias current to the injector junction; DC measurement; Nb; RF application; RF measurement; SFIFS junction; acceptor SIS junction; amplifier; current-voltage characteristic; digital application; ferromagnetic material; frequency 0.2 MHz; input-output isolator; insulator; memory application; multiterminal SFIFSIS device; superconducting-ferromagnetic multiterminal device; superconductor; transistor-like property; Josephson junctions; Junctions; Nickel; Niobium; Radio frequency; Voltage measurement; Josephson effect; ferromagnetism; quasiparticle injection; superconducting transistor; superconductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Superconductive Electronics Conference (ISEC), 2013 IEEE 14th International
Conference_Location :
Cambridge, MA
Print_ISBN :
978-1-4673-6369-3
Type :
conf
DOI :
10.1109/ISEC.2013.6604301
Filename :
6604301
Link To Document :
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