DocumentCode :
63478
Title :
Minimum Mission Cost Cold-Standby Sequencing in Non-Repairable Multi-Phase Systems
Author :
Levitin, Gregory ; Liudong Xing ; Yuanshun Dai
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
63
Issue :
1
fYear :
2014
fDate :
Mar-14
Firstpage :
251
Lastpage :
258
Abstract :
This paper considers the optimal cold standby element sequencing problem (SESP) for 1-out-of- n: G heterogeneous non-repairable cold-standby systems that accomplish multi-phase missions. Given a fixed set of element choices, the objective of the optimal system design is to select the initiation sequence of the system elements so as to minimize the expected mission cost while providing a desired level of system reliability. It is assumed that during different mission phases the elements are exposed to different stresses, which affects their time-to-failure distributions. The startup and exploitation costs of system elements are also phase dependent. We suggest an algorithm for evaluating the mission reliability and expected mission cost based on a discrete approximation of time-to-failure distributions of the system elements. A genetic algorithm is used as an optimization tool for solving the formulated SESP for multi-phase cold-standby systems. Examples are given to illustrate the considered problem and the proposed solution methodology.
Keywords :
approximation theory; consecutive system reliability; genetic algorithms; 1-out-of- n: G heterogeneous nonrepairable cold-standby systems; SESP; discrete approximation; element choices; expected mission cost minimization; exploitation costs; genetic algorithm; minimum mission cost cold-standby sequencing; mission reliability evaluation; multiphase cold-standby systems; optimal cold standby element sequencing problem; optimization tool; startup costs; system reliability; time-to-failure distributions; Acceleration; Optimization; Redundancy; Sequential analysis; Stress; Switches; Cold standby; discrete time-to-failure distribution; multi-phase system; optimal sequencing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2014.2299192
Filename :
6714517
Link To Document :
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