• DocumentCode
    634916
  • Title

    Binary-Level Testing of Embedded Programs

  • Author

    Bardin, Sabine ; Baufreton, Philippe ; Cornuet, Nicolas ; Herrmann, Patrick ; Labbe, Sebastien

  • Author_Institution
    LIST, CEA, Saclay, France
  • fYear
    2013
  • fDate
    29-30 July 2013
  • Firstpage
    11
  • Lastpage
    20
  • Abstract
    Dynamic Symbolic Execution (DSE) is a powerful approach to automatic test data generation. It has been heavily used in recent years for finding bugs in desktop programs. In this article, we discuss the use of binary-level DSE for testing safety-critical embedded systems. More especially, we present several innovative features implemented in our DSE tool OSMOSE, and we show through four case-studies how these features can be used in practical situations.
  • Keywords
    embedded systems; program compilers; program testing; safety-critical software; DSE tool OSMOSE; automatic test data generation; binary level DSE; binary level testing; desktop programs; dynamic symbolic execution; embedded programs; safety critical embedded systems; Aerodynamics; Cognition; Embedded systems; Search engines; Standards; Testing; automatic testing; binary-level analysis; symbolic execution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Software (QSIC), 2013 13th International Conference on
  • Conference_Location
    Najing
  • Type

    conf

  • DOI
    10.1109/QSIC.2013.49
  • Filename
    6605904
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=634916