DocumentCode :
635436
Title :
Intensity dependent spatial quantization with application in HEVC
Author :
Naccari, Matteo ; Mrak, Marta
Author_Institution :
R&D, British Broadcasting Corp., London, UK
fYear :
2013
fDate :
15-19 July 2013
Firstpage :
1
Lastpage :
6
Abstract :
With the increase of video resolutions used in multimedia applications, solutions for improved compression are sought. The next generation video compression standard, High Efficiency Video Coding (HEVC) is being developed by ITU-T and ISO/IEC MPEG with the goal to provide significant improvements over H.264/AVC. To further increase compression capabilities of HEVC, this paper proposes an additional bitrate saving mechanism. In this context, an Intensity Dependant Spatial Quantization (IDSQ) perceptual tool is proposed which exploits the intensity masking of the human visual system and perceptually adjusts quantization. The proposed IDSQ allows for adaptation to the video characteristics and its design meets low complexity implementation requirements. The proposed IDSQ has been tested in the HEVC test model and its performance is reported under “just noticeable distortion” or “perceptually lossless” conditions. In this setup, bitrate reductions of up to 25% are reported with an average of 3.4% over an exhaustive test setup.
Keywords :
data compression; image resolution; multimedia systems; video coding; H.264/AVC; HEVC compression capabilities; HEVC test model; IDSQ perceptual tool; ISO/IEC MPEG; ITU-T; bitrate reduction; bitrate saving mechanism; complexity implementation requirements; high efficiency video coding; human visual system; intensity dependant spatial quantization perceptual tool; intensity masking; multimedia applications; next generation video compression standard; video characteristics; video resolution; Bit rate; Encoding; Quantization (signal); Sensitivity; Video codecs; Video coding; HEVC; Human visual system; luminance masking; quantization; video coding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo (ICME), 2013 IEEE International Conference on
Conference_Location :
San Jose, CA
ISSN :
1945-7871
Type :
conf
DOI :
10.1109/ICME.2013.6607535
Filename :
6607535
Link To Document :
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